Research Preview

Standardized spin defect
characterization — off the shelf

Concept visualization of the AnalysePlatform — compact benchtop spin defect characterization system Concept visualization — not final product
Benchtop No optical table required - any table works
Enclosed Integrated laser safety
Turnkey Sample in, report out
All-in-one MW source & RF electronics included

A compact, laser-safe system for reproducible characterization of color centers in diamond and SiC. From confocal scan to standardized qubit and quantum sensor characterization — with comparable, export-ready reports.

Help Shape the Product 3-minute survey — your input defines what we build

The problem

Spin defect characterization today is manual, fragmented, and person-dependent. There is no off-the-shelf system for it.

Person-dependent results

Analysis relies on custom scripts written by individuals. When they leave, the knowledge leaves with them.

No standardized workflow

Every lab builds its own pipeline from scratch — confocal setup, measurement scripts, analysis code, reporting. Nothing is reusable.

Reproducibility is hard to prove

Results vary between people, setups, and time. Comparing measurements across samples, batches, or labs requires manual effort.

No dedicated QC tool exists

Startups manufacturing diamond or SiC substrates must characterize every batch — but there is no commercial system built for this.

Custom setup vs. standardized system

Today Weeks per sample Custom scripts, manual alignment, person-dependent analysis. Results vary between people and setups.
With AQD Sample in, report out Standardized workflow, automated analysis, comparable results. Same measurement, same outcome — every time.

No more fragile pipelines. No more results that leave when the postdoc leaves.

What we're building

A dedicated, all-in-one characterization system — including microwave source, RF electronics, and laser. Not a replacement for your confocal, but the missing piece between raw measurements and comparable results.

Confocal scan & localization

Find and identify color centers with integrated confocal optics.

Standardized measurements

Run ODMR, Rabi, Ramsey, and more with pre-defined, reproducible sequences.

Automated analysis

Fits, parameter extraction, and quality checks — no custom scripts needed.

Comparable reports & metrics

Standardized output you can compare across samples, people, and time. Export-ready.

Diamond — NV centers
SiC — VSi, divacancy

Who this is for

Whether you're characterizing samples for research or for production quality control — the pain is the same.

Research labs Complement your confocal with standardized analysis and reporting
Quantum startups Characterize every device or batch — on-site, reproducibly, without external services
Diamond & SiC manufacturers Quality control for quantum-grade substrates at production scale

Built by the people who live the problem

We're a spinoff from the 3rd Institute of Physics at the University of Stuttgart, home to one of the world's leading groups in diamond spin physics under Prof. Dr. Jörg Wrachtrup.

We've spent years running exactly the characterization workflows we're now building a product around. We know the late nights fitting ODMR spectra with fragile scripts. We know what it's like when a colleague leaves and their analysis pipeline leaves with them. We know the pain — because it's our pain too.

Our vision is simple: every lab that works with spin defects should have a standardized characterization tool on the bench — the same way every chemistry lab has a spectrometer. Not a pile of custom scripts, but a proper instrument.

Shape what we build

We're designing the first version right now. If you participate early, your needs directly influence the specs. This is your chance to get the tool you actually want — not what we think you need.

Take the Survey
Idea IDEA
YOU

Help us build the right thing

This is an early-stage survey to gauge general interest — no commitment, no sign-up. We're learning how labs and companies characterize spin defects today. Your input directly shapes what we build.

The product your input shapes THE PRODUCT
University of Stuttgart spinoff Integrated laser safety Standardized & reproducible Benchtop — no optical table Developed in Germany

Frequently asked questions

What defect types does the system support?

The first version focuses on nitrogen-vacancy (NV) centers in diamond and silicon vacancy (VSi) and divacancy defects in silicon carbide (SiC). These are the most widely studied color centers for quantum sensing and quantum information.

Do I need an existing confocal setup?

No. The system includes integrated confocal optics, laser, microwave source, and RF electronics. It is a standalone benchtop instrument — no optical table or additional hardware required.

How does this differ from a general-purpose confocal microscope?

General-purpose confocals are flexible but require you to build everything on top: measurement sequences, analysis pipelines, reporting. Our system is purpose-built for spin defect characterization — standardized sequences, automated fitting, and comparable reports out of the box.

What stage is the project in?

We are in the market validation phase. The product is being designed based on direct input from potential users. If you take the survey, your needs directly shape the specs of the first version.

Can I export measurement data?

Yes. All raw data and analysis results will be exportable in standard formats. We believe your data belongs to you — no lock-in.